Signal receiver circuit capable of improving area and power efficiency in semiconductor integrated circuits

ABSTRACT

A signal receiver circuit includes a first level detector for offset-controlling a first output node in response to a pair of first reference signals. A second level detector offset-controls a second output node in response to a pair of second reference signals.

CROSS-REFERENCES TO RELATED APPLICATIONS

The present application claims priority under 35 U.S.C. 119(a) to Koreanapplication number 10-2007-0014242, filed on Feb. 12, 2007, which isincorporated by reference in its entirety as if set forth in full.

BACKGROUND

1. Technical Field

The present invention relates to semiconductor integrated circuits(ICs), and more particularly, to apparatuses and methods for improvingthe area efficiency and the power efficiency in semiconductor ICs.

2. Related Art

Recently, semiconductor ICs have tended toward high-speed,high-integration and mass-storage. In order to realize such advancedsemiconductor ICs, various advanced technologies have been suggested.For instance, a multi-level transmission technology has been extensivelyused as an information transmission technology. In multi-leveltransmission apparatus, information having a plurality of bits can betransmitted as a one-bit data signal. The multi-bit transmittedinformation is decoded from the one bit data signal based on a signallevel thereof. That is, unlike prior technology in which a single bit ofdata can only convey one of two discrete signal levels, i.e., high andlow, multi-level transmission technology allows a single bit of data toconvey a plurality of signal levels, e.g., 4 signal levels. Accordingly,such multi-level transmission apparatus exhibit improved informationtransmission speeds.

Conventional signal receiver circuits used for implementing such amulti-level transmission approach include a preamplifier and aregenerative amplifier having resistors that occupy a relatively largespace. Consequently, the area efficiency for such apparatuses isreduced. Additionally, since conventional signal receiver circuit has aplurality of electric elements, a large amount of power is required todrive the electric element. Thus, power consumption is increased and theperformance of the semiconductor IC is degraded. There presently is nomeans for solving the problems of conventional signal receiver circuitwhen implementing multi-level transmission.

SUMMARY

A signal receiver circuit is capable of multi-level transmission andprovides an increased area margin and therefore improved powerefficiency.

In one aspect, a signal receiver circuit includes: a first leveldetecting unit configured to offset-control a first output node inresponse to a pair of first reference signals; and a second leveldetecting unit configured to offset-control a second output node inresponse to a pair of second reference signals.

In another aspect, a signal receiver circuit includes: a first node; asecond node; an output node; a first input unit configured to control avoltage level of the first node in response to a main input signal; asecond input unit configured to control a voltage level of the secondnode in response to a sub-input signal; a first offset unit configuredto control the voltage level of the first node in response to a mainreference signal; a second offset unit configured to control the voltagelevel of the second node in response to a sub-reference signal; and asignal processor configured to amplify and latch a voltage level of theoutput node corresponding to the voltage levels of the first and secondnodes in synchronization with a clock signal.

In still another aspect, a signal receiver circuit is configured toreceive an input signal comprising multiple data bits, the signalreceiver circuit includes: a plurality of level detecting unitsconfigured to receive the input signal and compare the voltage level ofthe input signal to a corresponding threshold voltage and generate adetection signal with a value based on the comparison, wherein thethreshold voltage is generated from a reference voltage and the inverseof the reference voltage; and a decoder coupled with the plurality oflevel detecting units, the decoder configured to determine a value forthe bits of data included in the input signal based on the value of thedetection signals.

These and other features, aspects, and embodiments are described belowin the section entitled “Detailed Description.”

BRIEF DESCRIPTION OF THE DRAWINGS

Features, aspects, and embodiments are described in conjunction with theattached drawings, in which:

FIG. 1 is a block diagram illustrating an example signal receivercircuit according to one embodiment;

FIG. 2 is a diagram illustrating the operation of the signal receivercircuit shown in FIG. 1; and

FIG. 3 is a schematic diagram illustrating an example implementation ofa first level detector included in the signal receiver circuit shown inFIG. 1.

DETAILED DESCRIPTION

FIG. 1 is a block diagram illustrating an example signal receivercircuit 100 according to an embodiment, in which the signal receivercircuit 100 can receive multiple bits of information from a one-bitinput signal, wherein the multiple bits of information correspond tovoltage levels of the input signal. It will be understood that theembodiment of FIG. 1 is presented by way of example and is not intendedto limit the apparatus and methods described herein to a particulardesign or architecture, or to a certain number of input voltage levels.

As shown in FIG. 1, the signal receiver circuit 100 receives an inputsignal (in) and includes a first detector 10, a second detector 20, athird detector 30 and a decoder 40. The first detector 10 can beconfigured to detect whether the input signal (in) exceeds a firstthreshold level. When the input signal (in) exceeds the first thresholdlevel, the first detector 10 can enable a first detection signal (det1).The second detector 20 can be configured to detect whether the inputsignal (in) exceeds a second threshold level, and to enable a seconddetection signal (det2) when the input signal (in) does exceed thesecond threshold level. The third detector 30 can be configured todetect whether the input signal (in) exceeds a third threshold level,and to enable a third detection signal (det3) when the input signal (in)does exceed the third threshold level. The decoder 40 receives the firstto third detection signals (det1) to (det3) and determines the resultingdata values.

The first detector 10 can include a first level detector 110 configuredto detect the voltage level of the input signal (in) by amplifying andlatching the input signal (in) in response to a clock signal (clk) (seeFIG. 3) and a first reference signal (ref1) (see FIG. 3), and a firstlatch 120 configure to output the first detection signal (det1) bylatching the output signal of the first level detector 110.

The second detector 20 can include a second level detector 210configured to detect the voltage level of the input signal (in) byamplifying and latching the input signal (in) in response to the clocksignal (clk) and a second reference signal (ref2) (see FIG. 3), and asecond latch 220 configured to output the second detection signal (det2)by latching the output signal of the second level detector 210.

The third detector 30 can include a third level detector 310 configuredto detect the level of the input signal (in) by amplifying and latchingthe input signal (in) in response to the clock signal (clk) and a thirdreference signal (ref3) (see FIG. 3), and a third latch 320 configuredto output the third detection signal (det3) by latching the outputsignal of the third level detector 310.

The first to third reference signals (ref1) to (ref3) are level signalsfor setting the first to third threshold levels, respectively. As can beseen in FIG. 3, the input signal (in) and each reference signal (ref1),(ref2), and (ref3) can consist of a pair of signals including a mainsignal and a sub-signal, which is the inverse of the main signal.Similarly, the output signals of the first to third level detectors 110,210 and 310 can also consist of a pair of signals including a mainsignal and a sub-signal.

The operation of the signal receiver circuit 100 can be described indetail with reference to FIG. 2. As can be seen in FIG. 2, the firstthreshold level associated with first detector 10 can be higher than thesecond threshold level associated with the second detector 20, which inturn can be higher than the third threshold level associated with thethird detector 30. When the level of the input signal (in) exceeds thefirst threshold level, the first detector 10 can be configured to outputthe first detection signal (det1) having a high level. Similarly, thesecond detector 20 can be configured to also output the second detectionsignal (det2) having a high level, since the voltage level of the inputsignal (in) will also exceed the second threshold level. The thirddetector 30 can also be configured to output the third detection signal(det3) having a high level, since the voltage level of the input signalwill also exceed the third threshold level.

Thus, the input to decoder 40, i.e., detection signals (det1), (det2),and (det3), can have the value (1,1,1), i.e., a high voltage level onany of detection signals (det1), (det2), and (det3) can be interpretedas a logic “1” by decoder 40. Of course, in other embodiments a highvoltage level on any of detection signals (det1), det2), and (det3) canbe interpreted as a logic “0” by decoder 40.

Continuing with FIG. 2, when the input signal (in) has a voltage levellower than the first threshold level, but higher than the secondthreshold level, then first detector 10 can be configured to output thefirst detection signal (det1) having a low level. The second detector 20and third detector 30 can, however, be configured to output the seconddetection signal (det2) and third detection signal (det3), respectively,having a high level, since the voltage level of the input signal (in)exceeds the second and third thresholds. Thus, the input to decoder 40will be (0,1,1) in such a scenario.

Still continuing with FIG. 2, when the input signal (in) has a voltagelevel lower than the second threshold level, but higher than the thirdthreshold level, then the first detector 10 and second detector 20 canbe configured to output a low level on detection signals (det1) and(det2), respectively; however, the third detector 30 can be configuredto output the third detection signal det3 having a high level, since thevoltage level of the input signal (in) exceeds the third threshold. Atthis time, the input to detector 40 will be (0, 0, 1).

Finally, in the example of FIG. 2, when the input signal (in) has avoltage level lower than the third level, then the first detector 10,second detector 20, and third detector 30 can each be configured togenerated a low level on detection signals (det1), (det2), and (det3),respectively, since the input signal (in) voltage level is below allthree threshold levels. At this time, the input to decoder 40 will be(0, 0, 0).

Thus, three bits of data can be detected from the one-bit input signal(in) in the signal receiver circuit 100. It will also be understood thatadditional bits of data can be detected from the one-bit input signal(in) by adding additional detectors and defining additional thresholdvoltages.

FIG. 3 is a schematic diagram illustrating an example implementation ofthe first level detector 110 shown in FIG. 1. it will be understood thatthe description of level detector 110 can apply equally to leveldetectors 210 and 310, although such does not necessarily have to be thecase.

As shown in FIG. 3, the first level detector 110 includes a signalprocessor 111, a first input unit 112, a second input unit 113, a firstcontroller 114, a first offset unit 115, a second offset unit 116 and asecond controller 117.

The signal processor 111 can be configured to respond to the clocksignal (clk) and to control the voltage levels of a pair of output nodesNout and /Nout in correspondence with the voltage levels of the firstand second nodes N1 and N2. The signal processor 111 can include a firsttransistor TR1, which can comprise a gate terminal receiving the clocksignal (clk), a source terminal coupled with an external power supplysignal (VDD), and a drain terminal coupled with the sub-output node/Nout, a second transistor TR2, which can comprise a gate terminalcoupled with the main output node Nout, a source terminal coupled withthe external power supply signal (VDD), and a drain terminal coupledwith the sub-output node /Nout, a third transistor TR3, which cancomprise a gate terminal receiving the clock signal (clk), a sourceterminal coupled with the external power supply signal (VDD), and adrain terminal coupled with the main output node Nout, and a fourthtransistor TR4, which can comprise a gate terminal coupled with thesub-output node /Nout, a source terminal coupled with the external powersupply signal (VDD), and a drain terminal coupled with the main outputnode Nout.

In addition, the signal processor 111 can include a fifth transistorTR5, which can comprise a gate terminal receiving the clock signal (clk)and disposed between the main output mode Nout and the sub-output node/Nout, a sixth transistor TR6, which can comprise a gate terminalcoupled with the main output node Nout, a drain terminal coupled withthe sub-output node /Nout, and a source terminal coupled with a firstnode N1, and a seventh transistor TR7, which can comprise a gateterminal coupled with the sub-output node /Nout, a drain terminalcoupled with the output node Nout, and a source terminal coupled with afirst node N2.

The first input unit 112 can be configured to control the voltage levelof the first node N1 in response to the main input signal (in). Thefirst input unit 112 can include an eighth transistor TR8, which cancomprise a gate terminal receiving the main input signal (in), a drainterminal coupled with the first node N1, and a source terminal coupledwith a third node N3.

The second input unit 113 can be configured to control the voltage levelof the second node N2 in response to the sub-input signal (/in). Thesecond input unit 113 can include a ninth transistor TR9, which cancomprise a gate terminal receiving the sub-input signal (/in), a drainterminal coupled with the second node N2, and a source terminal coupledwith the third node N3.

The first controller 114 can be configured to control the first andsecond input units 111 and 112 in response to the clock signal (clk) andthe power down signal (pwrdn). The first controller 114 can include atenth transistor TR10, which can comprise a gate terminal receiving theclock signal (clk) and a drain terminal coupled with the third node N3,and an eleventh transistor TR11, which can comprise a gate terminalreceiving the power down signal (pwrdn), a drain terminal coupled withthe source terminal of the tenth transistor TR10 and a source terminalthat is grounded.

The first offset unit 115 can be configured to control the voltage levelof the first node N1 in response to the first main reference signal(ref1). The first offset unit 115 can include a twelfth transistor TR12,which can comprise a gate terminal receiving the first reference signal(ref1), a drain terminal coupled with the first node N1, and a sourceterminal coupled with a fourth node N4.

The second offset unit 116 can be configured to control the voltagelevel of the second node N2 in response to the first sub-referencesignal (/ref1). The second offset unit 116 can include a thirteenthtransistor TR12, which can comprise a gate terminal receiving the firstsub-reference signal (/ref1), a drain terminal coupled with the secondnode N2, and a source terminal coupled with the fourth node N4.

The second controller 117 can be configured to control the first andsecond offset units 115 and 116 in response to the clock signal (clk)and the offset enable signal (offen). The second controller 117 caninclude a fourteenth transistor TR14, which can comprise a gate terminalreceiving the clock signal (clk), and a drain terminal coupled with thefourth node N4, and a fifteenth transistor TR15, which can comprise agate terminal receiving the offset enable signal (offen), a drainterminal coupled with the source terminal of the fourteenth transistorTR14, and a source terminal that is grounded.

The offset enable signal (offen) can be used to enable the signalreceiver circuit 100. The power down signal (pwrdn) can be a low enablesignal used for stopping the operation of the signal receiver circuit100 in the power down mode.

It can be understood from the structure of the first level detector 110that the first level detector 110 acts as a sense amplifier, which isoperational only when the clock signal (clk) transitions to a highlevel. That is, since the first node N1 is maintained in a predeterminedlevel by the first reference signal (ref1), if the level of the inputsignal (in) is sufficient to lower the voltage level of the first nodeN1, the voltage levels of the first node N1 and the sub-output node/Nout are lowered. In addition, if the voltage level of the sub-outputnode /Nout transitions to a low level, then the voltage level of themain output node Nout will transition to a high level.

In contrast, if the level of the input signal (in) is insufficient tolower the voltage level of the first node N1, the voltage level of thesub-input signal (/in) will be sufficient to lower the voltage level ofthe second node N2. At this time, the voltage level of the main outputnode Nout will transition to a low level.

Through the above procedure, the first level detector 110 detectswhether the voltage level of the input signal (in) exceeds the firstthreshold level. In addition, similarly to the first level detector 110,the second and third level detectors 210 and 310 can be configured todetect whether the voltage level of the input signal (in) exceeds thesecond and third threshold levels, respectively.

Moreover, such an implementation of a signal receiver circuit 100 can beimplemented with area efficiency as compared with the conventionalsignal receiver circuit designs. This is because conventional designsemploy a preamplifier and a regenerative amplifier, which each require alarge, area intensive resistor. The signal receiver circuit describedherein does not require such large resistors and can therefore not onlybe laid out in a more efficient manner, but can also lower powerconsumption since circuit 100 only operates when the clock signal (clk)is high.

While certain embodiments have been described above, it will beunderstood that the embodiments described are by way of example only.Accordingly, the apparatus and methods described herein should not belimited based on the described embodiments. Rather, the apparatus andmethods described herein should only be limited in light of the claimsthat follow when taken in conjunction with the above description andaccompanying drawings.

1. A signal receiver circuit in a semiconductor integrated circuitcomprising: a first level detecting unit configured to offset-control afirst output node in response to a pair of first reference signals; anda second level detecting unit configured to offset-control a secondoutput node in response to a pair of second reference signals.
 2. Thesignal receiving circuit as claimed in claim 1, wherein the first leveldetecting unit is configured to control voltage levels of first andsecond nodes in response to a pair of input signals and the pair offirst reference signals, and control a voltage level of the first outputnode corresponding to the voltage levels of the first and second nodes.3. The signal receiving circuit as claimed in claim 2, wherein the firstlevel detecting unit comprises: a signal processor configured to respondto a clock and control the voltage level of the first output nodecorresponding to the voltage levels of the first and second nodes; afirst input unit configured to control the voltage level of the firstnode in response to a main input signal of the pair of input signals; asecond input unit configured to control the voltage level of the secondnode in response to a sub-input signal of the pair of input signals; afirst offset unit configured to control the voltage level of the firstnode in response to a main reference signal of the pair of the firstreference signals; and a second offset unit configured to control thevoltage level of the second node in response to a sub-reference signalof the pair of the first reference signals.
 4. The signal receivingcircuit as claimed in claim 1, wherein the second level detecting unitis configured to control voltage levels of first and second nodes inresponse to a pair of input signals and the pair of second referencesignals, and control a voltage level of the second output nodecorresponding to the voltage levels of the first and second nodes. 5.The signal receiving circuit as claimed in claim 4, wherein the secondlevel detecting unit comprises: a signal processor configured to respondto a clock and control the voltage level of the second output nodecorresponding to the voltage levels of the first and second nodes; afirst input unit configured to control the voltage level of the firstnode in response to a main input signal of the pair of input signals; asecond input unit configured to control the voltage level of the secondnode in response to a sub-input signal of the pair of input signals; afirst offset unit configured to control the voltage level of the firstnode in response to a main reference signal of the pair of the secondreference signals; and a second offset unit configured to control thevoltage level of the second node in response to a sub-reference signalof the pair of the second reference signals.
 6. The signal receivingcircuit as claimed in claim 1, further comprising: a first latchconfigured to output a first detection signal by latching an outputsignal of the first level detecting unit; and a second latch configuredto output a second detection signal by latching an output signal of thesecond level detecting unit.
 7. The signal receiving circuit as claimedin claim 6, further comprising a decoder configured to receive the firstand second detection signals to restore data.
 8. A signal receivercircuit in a semiconductor integrated circuit comprising: a first node;a second node; an output node; a first input unit configured to controla voltage level of the first node in response to a main input signal; asecond input unit configured to control a voltage level of the secondnode in response to a sub-input signal; a first offset unit configuredto control the voltage level of the first node in response to a mainreference signal; a second offset unit configured to control the voltagelevel of the second node in response to a sub-reference signal; and asignal processor configured to amplify and latch a voltage level of theoutput node corresponding to the voltage levels of the first and secondnodes in synchronization with a clock signal.
 9. The signal receivercircuit as claimed in claim 8, further comprising a first controllerconfigured to control the first and second input units in response tothe clock signal and a power down signal.
 10. The signal receivercircuit as claimed in claim 6, further comprising a second controllerconfigured to control the first and second offset units in response tothe clock signal and an offset enable signal.
 11. The signal receivercircuit as claimed in claim 6, further comprising a latch configured tooutput a detection signal by latching a signal output from the outputnode.
 12. The signal receiver circuit as claimed in claim 9, furthercomprising a decoder configured to receive the detection signal and torestore data.
 13. A signal receiver circuit in a semiconductorintegrated circuit configured to receive an input signal comprisingmultiple data bits, the signal receiving circuit comprising: a pluralityof level detecting units configured to receive the input signal andcompare the voltage level of the input signal to a correspondingthreshold voltage and generate a detection signal with a value based onthe comparison, wherein the threshold voltage is generated from areference voltage and the inverse of the reference voltage; and adecoder coupled with the plurality of level detecting units, the decoderconfigured to determine a value for the bits of data included in theinput signal based on the value of the detection signals.